All Systems Include Extensive Datalogging Capability

Novtek Product Descriptions

CYCLING SYSTEMS

FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures.  A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.

Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and .  In addition to FLASH, the systems can also accommodate MRAM,  EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA),  embedded FLASH microcontrollers and NVM based FPGA.  The system's environmental chamber has a range of -55^oC to +200^oC and is ideal for temperature characterization of memory based devices and packages.